Aufsatz in einer Fachzeitschrift
Manifestation of doubly excited atomic states in the photoionization cross-sections of Ar, Kr and Xe in the vicinity of the subvalence ns-shell threshold



Details zur Publikation
Autor(inn)en:
Schmoranzer, H.; Lauer, S.; Liebel, H.; Ehresmann, A.; Demekhin, P.; Lagutin, B.; Petrov, I.; Sukhorukov, V.
Publikationsjahr:
2001
Zeitschrift:
Journal of Electron Spectroscopy and Related Phenomena
Seitenbereich:
135-140
Jahrgang/Band:
114
Erste Seite:
135
Letzte Seite:
140
ISSN:
0368-2048

Zusammenfassung, Abstract
Energy dependences of the total and partial ns-photoionization cross-sections in the vicinity of the ns-subvalence shell threshold were measured for the rare-gas atoms using photon-induced fluorescence spectroscopy. A resolution of 4.5, 3, and 1 meV was attained for Ar, Kr and Xe, respectively. The experimental cross-sections exhibit many well-resolved resonances of different shapes which are connected with the photoionization through the doubly excited atomic states. Calculated photoionization cross-sections of Ar and Kr show that some resonances are determined by doubly excited states including strongly delocalized n′f-excited electrons.


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Zuletzt aktualisiert 2019-25-07 um 15:42