Journal article
Failure stress of epitaxial silicon thin films



Publication Details
Authors:
Käsewieter, J.; Kajari-Schröder, S.; Niendorf, T.; Brendel, R.
Publication year:
2013
Journal:
Energy Procedia
Pages range:
926-932
Volume number:
38
ISSN:
1876-6102


Last updated on 2021-27-01 at 07:50