Journal article

Failure stress of epitaxial silicon thin films

Publication Details

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Authors:

Käsewieter, J.; Kajari-Schröder, S.; Niendorf, T.; Brendel, R.

Publication year:

2013

Journal:

Energy Procedia

Pages range:

926-932

Volume number:

38

ISSN:

1876-6102

DOI:	http://dx.doi.org/10.1016/j.egypro.2013.07.366

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Last updated on 2021-27-01 at 07:50