Aufsatz in einer Fachzeitschrift
Characterization of magnetic force microscopy probe tip remagnetization for measurements in external in-plane magnetic fields



Details zur Publikation
Autor(inn)en:
Weis, T.; Krug, I.; Engel, D.; Ehresmann, A.; Höink, V.; Schmalhorst, J.; Reiss, G.
Publikationsjahr:
2008
Zeitschrift:
Journal of Applied Physics
Seitenbereich:
123503
Jahrgang/Band:
104
ISSN:
0021-8979

Zusammenfassung, Abstract
A quantitative analysis of magnetic force microscopy (MFM) images taken in external in-plane magnetic fields is difficult because of the influence of the magnetic field on the magnetization state of the magnetic probe tip. We prepared calibration samples by ion bombardment induced magnetic patterning with a topographically flat magnetic pattern magnetically stable in a certain external magnetic field range for a quantitative characterization of the MFM probe tip magnetization in point-dipole approximation.


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Zuletzt aktualisiert 2019-25-07 um 12:37