Journal article
Characterization of magnetic force microscopy probe tip remagnetization for measurements in external in-plane magnetic fields



Publication Details
Authors:
Weis, T.; Krug, I.; Engel, D.; Ehresmann, A.; Höink, V.; Schmalhorst, J.; Reiss, G.
Publication year:
2008
Journal:
Journal of Applied Physics
Pages range:
123503
Volume number:
104
ISSN:
0021-8979

Abstract
A quantitative analysis of magnetic force microscopy (MFM) images taken in external in-plane magnetic fields is difficult because of the influence of the magnetic field on the magnetization state of the magnetic probe tip. We prepared calibration samples by ion bombardment induced magnetic patterning with a topographically flat magnetic pattern magnetically stable in a certain external magnetic field range for a quantitative characterization of the MFM probe tip magnetization in point-dipole approximation.


Research Areas


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