Conference proceedings article
The obvious and hidden values of IT-based peer assessment in management education



Publication Details
Authors:
Rietsche, R.; Söllner, M.
Editor:
Humphreys, John
Publisher:
AOM
Place:
Atlanta, Georgia, USA
Publication year:
2017
Pages range:
TBD
Book title:
Academy of Management Annual Meeting



Authors/Editors

Last updated on 2020-31-03 at 16:00