Journal article
An extended model for electrostatic tractions at crack faces in piezoelectrics



Publication Details
Authors:
Ricoeur, A.; Gellmann, R.
Publication year:
2011
Journal:
Proceedings of SPIE
Pages range:
79780L
Volume number:
7978
Number of pages:
11
ISSN:
0277-786X

Abstract


Recently, the theoretical framework of fracture mechanics of piezoelectrics has been extended to include electrostatically induced mechanical tractions in crack models yielding a significant crack closure effect. (1-3) However, these models are still simple, neglecting e.g. the piezoelectric field coupling. In this work, an extended model for crack surface tractions is presented yielding some interesting effects. In particular, it is predicted that the Mode-I stress intensity factor is influenced by both a collinear normal stress parallel to the crack faces and a Mode-II shear loading. Also, the direction of electric field vs. poling direction is clearly manifested in the calculated crack loading quantities.




Keywords
Coulomb stresses, crack boundary conditions, crack surface tractions, dielectric interfaces, fracture mechanics, Griffith crack, Piezoelectrics

Last updated on 2019-25-07 at 13:59