Raman scattering, photoluminescence, and X-ray diffraction studies of GaN layers grown on misoriented sapphire substrates - Research Information System | University of Kassel

Journal article

Raman scattering, photoluminescence, and X-ray diffraction studies of GaN layers grown on misoriented sapphire substrates

Publication Details

Authors:

Benyoucef, M.; Kuball, M.; Koleske, D.; Wickenden, A.; Henry, R.; Fatemi, M.; Twigg, M.

Publication year:

2002

Journal:

Materials Science and Engineering: B

Pages range:

15-18

Volume number:

Issue number:

1-3

ISSN:

0921-5107

DOI:	http://dx.doi.org/10.1016/s0921-5107(02)00034-x

Authors/Editors

Last updated on 2020-07-02 at 11:23