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Formation of defects in cubic GaN grown on nano-patterned 3C-SiC (001) (2012)Niendorf, T.; Kemper, R.; Häberlen, M.; Schupp, T.; Weinl, M.; Bürger, M.; Ruth, M.; Maier, H.; Lischka, K.; Lindner, J.; As, D.; Meier, C.Conference proceedings article |
Free range for organic pullets? (2012)Keppler, C.; Baumann, W.; Smajlhodzic, F.; Niebuhr, K.; Johannsen, N.; Staack, M.; Knierim, U.Conference proceedings article |
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