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Epitaxial Growths and Magnetization Dynamics of Ni₂MnSn Heusler Alloy Films



Details zur Publikation
Autor(inn)en:
Dubowik, J.; Goscianska, I.; Zaleski, K.; Glowinski, H.; Ehresmann, A.; Kakazei, G.; Bunyaev, S.
Publikationsjahr:
2012
Zeitschrift:
Acta Physica Polonica Series a
Seitenbereich:
1121-1123
Jahrgang/Band:
121
Erste Seite:
1121
Letzte Seite:
1123
ISSN:
0587-4246

Zusammenfassung, Abstract
Ferromagnetic resonance has been investigated in Ni2MnSn Heusler alloy films. The films were deposited at 673<T<723K on MgO(001) substrates by means of magnetron sputtering. X-ray diraction confirmed that the films were epitaxial. The films had magnetic parameters typical of bulk Ni2MnSn with L21 structural order. From angular dependences of the resonance field and the ferromagnetic resonance linewidth the intrinsic Gilbert contribution and extrinsic contribution to the ferromagnetic resonance linewidth due to two-magnon scattering were separated. Our data indicate a room temperature Gilbert damping of 0.007, which is comparable to that of half-metallic Heusler alloy. Surface roughness is responsible for a substantial extrinsic two-magnon contribution to the linewidth of the order of 50-300 Oe in these epitaxial soft magnetic Heusler alloy films. The spin wavestiness of D= 70-100meVÅ2 is one of the lowest for the known Heusler alloy.


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Zuletzt aktualisiert 2019-01-11 um 16:05

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