Dipl.-NanoSc. Timo Ueltzhöffer
Publikationen
2018 | Gaul, A., Emmrich, D., Ueltzhöffer, T., Huckfeldt, H., Douganay, H., Hackl, J., Khan, M., Gottlob, D.M., Hartmann, G.P.M., Beyer, A., Holzinger, D., Nemšák, S., Schneider, C., Gölzhäuser, A., Reiss, G., Ehresmann, A., 2018. Size limits of magnetic-domain engineering in continuous in-plane exchange-bias prototype films. Beilstein Journal of Nanotechnology 9, 2968–2979. https://doi.org/10.3762/bjnano.9.276 |
2018 | Koch, I., Granath, T., Hess, S., Ueltzhöffer, T., Deumel, S., Jauregui Caballero, C.I., Ehresmann, A., Holzinger, D., Mandel, K.S., 2018. Smart Surfaces: Magnetically Switchable Light Diffraction through Actuation of Superparamagnetic Plate-Like Microrods by Dynamic Magnetic Stray Field Landscapes. Advanced Optical Materials 6, 1800133. https://doi.org/10.1002/adom.201800133 |
2017 | Hans, A., Ozga, C., Seidel, R., Schmidt, P., Ueltzhöffer, T., Holzapfel, X., Wenzel, P., Reiss, P., Pohl, M.N., Unger, I., Aziz, E.F., Ehresmann, A., Slavícek, P., Winter, B., Knie, A., 2017. Optical Fluorescence Detected from X‑ray Irradiated Liquid Water. Journal of Physical Chemistry B 121, 2326–2330. https://doi.org/10.1021/acs.jpcb.7b00096 |
2017 | Hans, A., Ozga, C., Seidel, R., Schmidt, P., Ueltzhöffer, T., Holzapfel, X., Pohl, M.N., Wenzel, P., Reiß, P., Unger, I., Aziz, E.F., Ehresmann, A., Slavíček, P., Winter, B., Knie, A., 2017. Soft X-ray induced ultraviolet fluorescence emission from bulk and interface of a liquid water microjet. Journal of Physics: Conference Series 875, 042008. https://doi.org/10.1088/1742-6596/875/5/042008 |
2016 | Ueltzhöffer, T., Streubel, R., Koch, I., Holzinger, D., Makarov, D., Schmidt, O.G., Ehresmann, A., 2016. Magnetically Patterned Rolled-Up Exchange Bias Tubes: A Paternoster for Superparamagnetic Beads. ACS Nano 2016, 8491–8498. https://doi.org/10.1021/acsnano.6b03566 |
2015 | Ueltzhöffer, T., Schmidt, C., Krug, I., Nickel, F., Gottlob, D., Ehresmann, A., 2015. Néel walls between tailored parallel-stripe domains in IrMn/CoFe exchange bias layers. Journal of Applied Physics 117, 123904. https://doi.org/10.1063/1.4916093 |
