Conference proceedings article
Reliability of discrete power semiconductor packages and systems - D2Pak and CanPAK in comparison
Publication Details
Authors: | Hofmann, K.; Herold, C.; Beier, M.; Lutz, J.; Friebe, J. |
Editor: | IEEE |
Place: | Lille |
Publication year: | 2013 |
Pages range : | 1-10 |
Book title: | 2013 15th European Conference on Power Electronics and Applications EPE 2013 |
Title of series: | 2013 15th European Conference on Power Electronics and Applications EPE 2013 |
ISBN: | 9781479901166 |
DOI-Link der Erstveröffentlichung: |
Abstract
The reliability of discrete power semiconductor packages is getting more and more important in regard to the increasing number of power applications in the low power range. Therefore it is necessary to get more information and details on reliability of discrete packages and systems by performing reliability tests as well as simulations. In this paper the chosen approach and first results of simulations and tests are described on D2Pak and CanPAK systems as often used discrete power semiconductor packages.
The reliability of discrete power semiconductor packages is getting more and more important in regard to the increasing number of power applications in the low power range. Therefore it is necessary to get more information and details on reliability of discrete packages and systems by performing reliability tests as well as simulations. In this paper the chosen approach and first results of simulations and tests are described on D2Pak and CanPAK systems as often used discrete power semiconductor packages.
Keywords
Discrete power device Packaging Power cycling Reliability
