Aufsatz in einer Fachzeitschrift
Manifestation of doubly excited atomic states in the photoionization cross-sections of Ar, Kr and Xe in the vicinity of the subvalence ns-shell threshold
Details zur Publikation
Autor(inn)en: | Schmoranzer, H.; Lauer, S.; Liebel, H.; Ehresmann, A.; Demekhin, P.; Lagutin, B.; Petrov, I.; Sukhorukov, V. |
Publikationsjahr: | 2001 |
Zeitschrift: | Journal of Electron Spectroscopy and Related Phenomena |
Seitenbereich: | 135-140 |
Jahrgang/Band : | 114 |
Erste Seite: | 135 |
Letzte Seite: | 140 |
ISSN: | 0368-2048 |
DOI-Link der Erstveröffentlichung: |
Zusammenfassung, Abstract
Energy dependences of the total and partial ns-photoionization cross-sections in the vicinity of the ns-subvalence shell threshold were measured for the rare-gas atoms using photon-induced fluorescence spectroscopy. A resolution of 4.5, 3, and 1 meV was attained for Ar, Kr and Xe, respectively. The experimental cross-sections exhibit many well-resolved resonances of different shapes which are connected with the photoionization through the doubly excited atomic states. Calculated photoionization cross-sections of Ar and Kr show that some resonances are determined by doubly excited states including strongly delocalized n′f-excited electrons.
Energy dependences of the total and partial ns-photoionization cross-sections in the vicinity of the ns-subvalence shell threshold were measured for the rare-gas atoms using photon-induced fluorescence spectroscopy. A resolution of 4.5, 3, and 1 meV was attained for Ar, Kr and Xe, respectively. The experimental cross-sections exhibit many well-resolved resonances of different shapes which are connected with the photoionization through the doubly excited atomic states. Calculated photoionization cross-sections of Ar and Kr show that some resonances are determined by doubly excited states including strongly delocalized n′f-excited electrons.
