Journal article
Characterization of magnetic force microscopy probe tip remagnetization for measurements in external in-plane magnetic fields
Publication Details
Authors: | Weis, T.; Krug, I.; Engel, D.; Ehresmann, A.; Höink, V.; Schmalhorst, J.; Reiss, G. |
Publication year: | 2008 |
Journal: | Journal of Applied Physics |
Pages range : | 123503 |
Volume number: | 104 |
ISSN: | 0021-8979 |
DOI-Link der Erstveröffentlichung: |
URN / URL: |
Abstract
A quantitative analysis of magnetic force microscopy (MFM) images taken in external in-plane magnetic fields is difficult because of the influence of the magnetic field on the magnetization state of the magnetic probe tip. We prepared calibration samples by ion bombardment induced magnetic patterning with a topographically flat magnetic pattern magnetically stable in a certain external magnetic field range for a quantitative characterization of the MFM probe tip magnetization in point-dipole approximation.
A quantitative analysis of magnetic force microscopy (MFM) images taken in external in-plane magnetic fields is difficult because of the influence of the magnetic field on the magnetization state of the magnetic probe tip. We prepared calibration samples by ion bombardment induced magnetic patterning with a topographically flat magnetic pattern magnetically stable in a certain external magnetic field range for a quantitative characterization of the MFM probe tip magnetization in point-dipole approximation.
