Conference proceedings article
The obvious and hidden values of IT-based peer assessment in management education
Publication Details
Authors: | Rietsche, R.; Söllner, M. |
Editor: | Humphreys, John |
Publisher: | AOM |
Place: | Atlanta, Georgia, USA |
Publication year: | 2017 |
Pages range : | TBD |
Book title: | Academy of Management Annual Meeting |
DOI-Link der Erstveröffentlichung: |
