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Threshold scan of the Ne-2s electron photoionization cross section



Details zur Publikation
Autor(inn)en:
Schartner, K.; Möbus, B.; Mentzel, G.; Ehresmann, A.; Vollweiler, F.; Schmoranzer, H.

Publikationsjahr:
1992
Zeitschrift:
Physics Letters A
Seitenbereich:
393
Jahrgang/Band :
169
ISSN:
0375-9601


Zusammenfassung, Abstract
The photoionization of the Ne 2s-electrons was studied from threshold to 1 eV above threshold. The technique of photon-induced fluorescence spectroscopy was applied. Pronounced structures were observed resulting from autoionization of doubly excited atomic states. A threshold cross section of 0.17 Mb was determined.


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