Aufsatz in einer Fachzeitschrift
Electron-impact induced fluorescence for EUV spectrometer-detector calibration
Details zur Publikation
Autor(inn)en: | Knie, A.; Burbank, N.; Schmidt, P.; Ozga, C.; Ehresmann, A. |
Publikationsjahr: | 2012 |
Zeitschrift: | Journal of Electron Spectroscopy and Related Phenomena |
Seitenbereich: | 492-497 |
Jahrgang/Band : | 185 |
Erste Seite: | 492 |
Letzte Seite: | 497 |
ISSN: | 0368-2048 |
DOI-Link der Erstveröffentlichung: |
Zusammenfassung, Abstract
EUV-Spectra of electron-impact induced fluorescence from rare gases were recorded for an impact energy of 3.5keV intending their application in the first step for spectrometer wavelength scale calibrations. The spectra are in the investigated range of 165-314nm in good agreement with previously measured and calculated spectra. Nearly all observed lines could be identified including 196 new lines. 183 lines mainly for krypton and xenon could not be identified. The spectra are presented and discussed. A compendium of 1670 lines and their identification is added as supplementary tables. The spectra show a number of strong lines which are well suited for spectrometer wavelength scale calibrations and once their intensity relation is deduced can be used for a sensitivity determination of a spectrometer-detector combination as described in the introductory and experimental sections of the paper.
EUV-Spectra of electron-impact induced fluorescence from rare gases were recorded for an impact energy of 3.5keV intending their application in the first step for spectrometer wavelength scale calibrations. The spectra are in the investigated range of 165-314nm in good agreement with previously measured and calculated spectra. Nearly all observed lines could be identified including 196 new lines. 183 lines mainly for krypton and xenon could not be identified. The spectra are presented and discussed. A compendium of 1670 lines and their identification is added as supplementary tables. The spectra show a number of strong lines which are well suited for spectrometer wavelength scale calibrations and once their intensity relation is deduced can be used for a sensitivity determination of a spectrometer-detector combination as described in the introductory and experimental sections of the paper.
