Journal article

Raman mapping investigations and finite element analysis of double epitaxial lateral overgrown GaN on sapphire substrates



Publication Details
Authors:
Benyoucef, M.; Kuball, M.; Beaumont, B.; Bousquet, V.

Publication year:
2002
Journal:
Applied Physics Letters
Pages range :
2370-2372
Journal acronym:
AIP
Volume number:
81
Issue number:
13
ISSN:
0003-6951
eISSN:
1077-3118
DOI-Link der Erstveröffentlichung:




Authors/Editors

Last updated on 2023-13-12 at 10:00