Aufsatz in einer Fachzeitschrift

Applicability of focused Ion beam (FIB) milling with gallium, neon, and xenon to the fracture toughness characterization of gold thin films



Details zur Publikation
Autor(inn)en:
Preiß, E.; Merle, B.; Xiao, Y.; Gannott, F.; Liebig, J.; Wheeler, J.; Göken, M.
Verlag:
SPRINGER HEIDELBERG

Publikationsjahr:
2021
Zeitschrift:
Journal of Materials Research
Seitenbereich:
2505-2514
Jahrgang/Band :
36
Heftnummer:
12
Erste Seite:
2505
Letzte Seite:
2514
Seitenumfang:
10
ISSN:
0884-2914
DOI-Link der Erstveröffentlichung:


Zusammenfassung, Abstract
Focused ion beam (FIB) milling is an increasingly popular technique for fabricating micro-sized samples for nanomechanical characterization. Previous investigations have cautioned that exposure to a gallium ion beam can significantly alter the mechanical behavior of materials. In the present study, the effects of gallium, neon, and xenon ions are scrutinized. We demonstrate that fracture toughness measurements on freestanding gold thin films are unaffected by the choice of the ion species and milling parameters. This is likely because the crack initiation is controlled by the local microstructure and grain boundaries at the notch, rather than by the damaged area introduced by FIB milling. Additionally, gold is not susceptible to chemical embrittlement by common FIB ion species. This confirms the validity of microscale fracture measurements based on similar experimental designs.


Autor(inn)en / Herausgeber(innen)

Zuletzt aktualisiert 2022-21-12 um 04:00