Journal article

Outlier Elimination in Rough Surface Profilometry with Focus Variation Microscopy



Publication Details
Authors:
Xu, X.; Hagemeier, S.; Lehmann, P.

Publication year:
2022
Journal:
Metrology
Pages range :
263-273
Volume number:
2
Issue number:
2
DOI-Link der Erstveröffentlichung:




Authors/Editors

Last updated on 2023-30-01 at 13:35