Conference proceedings article
RAM tests for safety-related architectures: A first approach
Publication Details
Authors: | Schreiber, M.; Delic, E.; Hayek, A.; Börcsök, J. |
Editor: | IEEE |
Publication year: | 2014 |
Pages range : | 1-6 |
Book title: | 2014 International Symposium on Fundamentals of Electrical Engineering (ISFEE) |
ISBN: | 978-1-4799-6821-3 |
DOI-Link der Erstveröffentlichung: |
