Journal article

Thermomechanical stress analysis and measurement in quasi-monolithic integration technology (QMIT)



Publication Details
Authors:
Joodaki, M.; Kompa, G.; Hillmer, H.

Publication year:
2005
Journal:
IEEE Transactions on Device and Materials Reliability
Pages range :
581-594
Volume number:
5
Issue number:
3
ISSN:
1530-4388
eISSN:
1558-2574



Last updated on 2024-26-08 at 12:13